IEEE Instrumentation & Measurement Magazine
|
Ieee Instru Meas Mag |
1094-6969 |
78 |
1.7001 |
1.4000 |
1.6000 |
Journal of X-Ray Science and Technology
|
J X-Ray Sci Technol |
0895-3996 |
87 |
1.4999 |
1.3000 |
1.4000 |
Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
|
Nucl Instrum Meth A |
0168-9002 |
951 |
1.4000 |
1.1001 |
1.4000 |
Sensor Review
|
Sensor Rev |
0260-2288 |
78 |
1.7001 |
1.3000 |
1.4000 |
Journal of Instrumentation
|
J Instrum |
1748-0221 |
979 |
1.4000 |
1.0000 |
1.3000 |
Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms
|
Nucl Instrum Meth B |
0168-583X |
277 |
1.3000 |
1.1001 |
1.3000 |
Instrumentation Science & Technology
|
Instrum Sci Technol |
1073-9149 |
48 |
1.4999 |
1.3000 |
1.3000 |
Journal of Dynamic Systems Measurement and Control-Transactions of the Asme
|
J Dyn Syst-T Asme |
0022-0434 |
54 |
1.3000 |
1.3000 |
1.3000 |
Mapan-Journal of Metrology Society of India
|
Mapan-J Metrol Soc I |
0970-3950 |
75 |
1.1001 |
1.2001 |
1.3000 |
Metrology and Measurement Systems
|
Metrol Meas Syst |
0860-8229 |
53 |
1.0000 |
0.8000 |
1.1001 |
Journal of Sensors
|
J Sensors |
1687-725X |
68 |
1.4999 |
1.1001 |
1.1001 |
Accreditation and Quality Assurance
|
Accredit Qual Assur |
0949-1775 |
61 |
1.0000 |
0.8000 |
1.0000 |
Insight
|
Insight |
1354-2575 |
77 |
1.0000 |
1.0000 |
1.0000 |
Sensors and Materials
|
Sensor Mater |
0914-4935 |
391 |
0.8000 |
0.7000 |
1.0000 |
International Journal of Prognostics and Health Management
|
Int J Progn Health M |
2153-2648 |
36 |
1.6000 |
0.9000 |
1.0000 |
Automation and Remote Control
|
Automat Rem Contr+ |
0005-1179 |
86 |
0.5000 |
0.4000 |
0.5999 |
Instruments and Experimental Techniques
|
Instrum Exp Tech+ |
0020-4412 |
197 |
0.5000 |
0.4000 |
0.4000 |
Measurement Techniques
|
Meas Tech+ |
0543-1972 |
107 |
0.4000 |
0.2000 |
0.4000 |
Devices and Methods of Measurements
|
Devices Methods Meas |
2220-9506 |
30 |
0.2000 |
0.1000 |
0.2000 |
Ukrainian Metrological Journal
|
Ukr Metrol J |
2306-7039 |
31 |
0.1000 |
0.1000 |
0.2000 |
Journal of Research of the National Institute of Standards and Technology
|
J Res Natl Inst Stan |
2165-7254 |
0 |
1.3000 |
1.3000 |
1.3000 |
Measurement Science Review
|
Meas Sci Rev |
1335-8871 |
0 |
1.1001 |
0.8000 |
1.0000 |
Concepts in Magnetic Resonance Part B-Magnetic Resonance Engineering
|
Concept Magn Reson B |
1552-5031 |
0 |
1.3000 |
0.9000 |
0.9000 |
Tm-Technisches Messen
|
Tm-Tech Mess |
0171-8096 |
0 |
0.5999 |
0.5999 |
0.8000 |
Journal of Sensors and Sensor Systems
|
J Sens Sens Syst |
2194-8771 |
0 |
1.3000 |
0.8000 |
0.8000 |
Scanning [更名/剔除]
|
Scanning |
0161-0457 |
0 |
2.0489 |
1.4999 |
1.7501 |
Smart Materials & Structures [更名/剔除]
|
Smart Mater Struct |
0964-1726 |
0 |
0.0000 |
0.0000 |
0.0000 |
Measurement Science & Technology [更名/剔除]
|
Meas Sci Technol |
0957-0233 |
0 |
0.0000 |
0.0000 |
0.0000 |
Qirt Journal [更名/剔除]
|
Qirt J |
1768-6733 |
0 |
0.0000 |
0.0000 |
0.0000 |
American Laboratory [更名/剔除]
|
Am Lab |
0044-7749 |
0 |
0.0000 |
0.0000 |
0.0000 |